NANOTECHNOLOGY - The next generation technologies for future
         
 
   

We Offer

 
 
 
    Measurement of material structures using:


  • JSM-7001F Scanning Electron Microscope


    In case you are interested in measurement using the JEOL microscope, please send us an e-mail.
    We offer the following:
    • Technical consultations
    • Material measurement
    • Proposal of technical solutions