| |
|
|
|
|
| |
|
Facilities |
|
|
|
|
- JSM-7001F Scanning Electron Microscope
The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully eucentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage, and expandability with ideal geometry for EDS, WDS, EBSP, and CL.
The specimen chamber handles specimens up to 200mm in diameter.
A new Windows® XP based computer interface allows for unprecedented ease of operation including function buttons that switch operation modes quickly and easily. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once.
The JSM-7001F SEM also supports full integration of EDS, WDS, e-beam lithography, and an image database. Stage automation is standard with a 5-axis computer control of X, Y, Z Tilt and eucentric rotation.
- InfiniiVision 7000 Oscilloscope
The Agilent InfiniiVision 7000 Series oscilloscope shows a more accurate representation of target signals than any other
oscilloscope in its class, engineered with the best signal visibility. Quickly capture and analyze analog, digital, and serial
signals in real time with fast and responsive always-on MegaZoom III deep memory. The 7000 Series oscilloscope allows
you to see more subtle signal detail and more infrequent events than any other scope on the market.
Lab scope performance: 500 MHz bandwidth, 4 analog channels , 4 GSa/s sample rate , Standard 8 Mpts MegaZoom III deep memory
Engineered for the best signal visibility: 12.1” XGA display with 256 levels of intensity shows subtle signal detail, Industry’s-fastest uncompromised
update rate of up to 100,000 waveforms/sec displays infrequent events
Wide range of application packages: Serial decode including: I2C, SPI, CAN, LIN and RS-232/UART, Segmented memory
PC-based offline analysis and viewing of previously acquired data, Power analysis
|
|
|
| |
|
